By Mohammad Tehranipoor
Emerging Nanotechnologies: try out, disorder Tolerance and Reliability covers quite a few applied sciences which were constructing during the last a long time akin to chemically assembled digital nanotechnology, Quantum-dot mobile Automata (QCA), and nanowires and carbon nanotubes. each one of those applied sciences deals quite a few benefits and drawbacks. a few be afflicted by excessive energy, a few paintings in very low temperatures and a few others desire indeterministic bottom-up meeting. those rising applied sciences should not regarded as a right away alternative for CMOS expertise and should require a totally new structure to accomplish their functionality.
Emerging Nanotechnologies: try, illness Tolerance and Reliability brings all of those concerns jointly in a single position for readers and researchers who're drawn to this swiftly altering field.
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Semiconductor nanostructures are a box of huge and still-growing study curiosity. On one hand, they're already learned in mass items, e. g. , in high-electron-mobility field-effect transistors and quantum-well lasers. nonetheless, they enable, in specifically adapted platforms, the research of basic homes, corresponding to many-particle interactions of electrons in diminished dimensions.
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Extra resources for Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability (Frontiers in Electronic Testing)
However, this metric is useful only for simulation; in practice, it is diﬃcult to ascertain the actual number of defect-free blocks after fabrication. An eﬀective testing procedure should correctly identify a large fraction of these defect-free blocks, thereby minimizing wastage. To illustrate how a nanofabric (with defects) can be used to implement a real circuit, we take c17, an ISCAS’85 benchmark circuit, as an example. Figure 5a shows the schematic of c17. To map it to a nanofabric, since nanofabrics cannot implement inversion logic, we ﬁrst transform it into an equivalent circuit as shown in Fig.
The defect map can then be used by software tools to avoid faulty resources during system reconﬁguration. One metric of defect map quality is recovery, deﬁned as the percentage of defect-free nanoblocks and switchblocks that are correctly diagnosed . This Chapter 2: Testing Nanofabrics 1 39 22 2 3 23 6 7 (a) Original schematic 1 22 3 2 3 23 6 7 (b) Equivalent schematic Fig. 5. Schematics of c17 metric indicates the diagnostic accuracy of a testing procedure. It should also be ensured that no faulty blocks are diagnosed as defect-free.
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